Authors

Kwon, J.; Sharma, A.A.; Chen, C.; Fantini, Andrea; Jurczak, Gosia; Bain, J.; Picard, Y.; Skowronski, Marek

Conference

2016 IEEE International Reliability Physics Symposium (IRPS)

Title

Transient thermometry and HRTEM analysis of RRAM thermal dynamics during switching and failure

Publication type

Proceedings paper