Publication:
n-Channel bulk and DTMOS FinFETs: investigation of GIDL and gate leakage currents
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1967 since deposited on 2021-10-23
Acq. date: 2025-12-18
Citations
Metrics
Views
1967 since deposited on 2021-10-23
Acq. date: 2025-12-18
Citations