dc.contributor.author | Magan, Caio M. | |
dc.contributor.author | Martino, Joao A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | de Andrade, Maria Gloria C. | |
dc.date.accessioned | 2021-10-23T12:23:41Z | |
dc.date.available | 2021-10-23T12:23:41Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26938 | |
dc.source | IIOimport | |
dc.title | n-Channel bulk and DTMOS FinFETs: investigation of GIDL and gate leakage currents | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | 31st Symposium on Microelectronics Technology and Devices - SBMicro | |
dc.source.conferencedate | 29/08/2016 | |
dc.source.conferencelocation | Brasilia Brazil | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7731350/ | |
imec.availability | Published - open access | |