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IoT: Source of test challenges

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorZorian, Yervant
dc.contributor.authorKonijnenburg, Mario
dc.contributor.authorHuang, Chih-Tsun
dc.contributor.authorHsieh, Ping-Hsuan
dc.contributor.authorCockburn, Peter
dc.contributor.authorDelvaux, Jeroen
dc.contributor.authorRozic, Vladimir
dc.contributor.authorYang, Bohan
dc.contributor.authorSingelee, Dave
dc.contributor.authorVerbauwhede, Ingrid
dc.contributor.authorMayor, Cedric
dc.contributor.authorvan Rijsinge, Robert
dc.contributor.authorReyes, Cocoy
dc.date.accessioned2021-10-23T12:32:21Z
dc.date.available2021-10-23T12:32:21Z
dc.date.issued2016-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26962
dc.sourceIIOimport
dc.titleIoT: Source of test challenges
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorKonijnenburg, Mario
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecKonijnenburg, Mario::0000-0001-8016-0888
dc.source.peerreviewno
dc.source.beginpage1
dc.source.endpage10
dc.source.conference21th IEEE European Test Symposium - ETS
dc.source.conferencedate23/05/2016
dc.source.conferencelocationAmsterdam the Netherlands
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7519331
imec.availabilityPublished - imec


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