Gate stability of GaN-based HEMTs with p-type gate

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Authors

Meneghini, Matteo; Rossetto, Isabella; Rizzato, Vanessa; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico

ISSN

2079-9292

Issue

2

Journal

Electronics

Volume

5

Title

Gate stability of GaN-based HEMTs with p-type gate

Publication type

Journal article

Embargo date

9999-12-31

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