Show simple item record

New opportunities in device scaling: How the high performing strained Ge pFINFET can help the space industry?

dc.contributor.authorMitard, Jerome
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorCollaert, Nadine
dc.contributor.authorLinten, Dimitri
dc.contributor.authorEneman, Geert
dc.contributor.authorClaeys, Cor
dc.contributor.authorHeyns, Marc
dc.contributor.authorMocuta, Anda
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T12:52:14Z
dc.date.available2021-10-23T12:52:14Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27015
dc.sourceIIOimport
dc.titleNew opportunities in device scaling: How the high performing strained Ge pFINFET can help the space industry?
dc.typeOral presentation
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceNuclear and Space Radiation Conference - NSREC. Short course
dc.source.conferencedate11/07/2016
dc.source.conferencelocationPortland, OR USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
33657.pdf
Size:
286.0Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record