Authors

Pandey, R; Schulte-Braucks, Christian; Sajjad, R.N.; Barth, M.; Ghosh, R; Grisafe, B.; Sharma, P.; von den Driesch, Niels; Vohra, Anurag; Rayner, R.; Loo, Roger; Mantl, Siegfried; Buca, Dan; Yeh, C.C.; Wu, C-H.; Tsai, Wilman; Antoniadis, A.; Datta, Suman

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Performance benchmarking of p-type In0.65Ga0.35As/GaAs0.4Sb0.6 and Ge/Ge0.93Sn0.07 hetero-junction tunnel FETs for low voltage logic

Publication type

Proceedings paper

Embargo date

9999-12-31