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Phase analysis and thermal stability of thin films synthesized via solid state reaction of Ni with Si1-xGex substrate
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Phase analysis and thermal stability of thin films synthesized via solid state reaction of Ni with Si1-xGex substrate
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Peter, Antony
;
Witters, Thomas
;
Dutta, Shibesh
;
Hikavyy, Andriy
;
Vaesen, Inge
;
Van Elshocht, Sven
;
Schaekers, Marc
Journal
Microelectronic Engineering
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1951
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1951
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-10
Citations