Publication:
Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
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1945 since deposited on 2021-10-23
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Acq. date: 2025-10-24
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Views
1945 since deposited on 2021-10-23
412item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations