Authors

Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico

ISSN

0026-2714

Journal

Microelectronics Reliability

Volume

64

Title

Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis

Publication type

Journal article