Authors

Simicic, Marko; Subirats, Alexandre; Weckx, Pieter; Kaczer, Ben; Franco, Jacopo; Roussel, Philippe; Linten, Dimitri; Thean, Aaron; Groeseneken, Guido; Gielen, Georges

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Comparative experimental analysis of time-dependent variability using a transistor test array

Publication type

Proceedings paper