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Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching

dc.contributor.authorSubhechha, Subhali
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorChen, Yangyin
dc.contributor.authorClima, Sergiu
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-23T15:17:44Z
dc.date.available2021-10-23T15:17:44Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27359
dc.sourceIIOimport
dc.titleExtensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching
dc.typeProceedings paper
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage6C.2
dc.source.conferenceIEEE International Reliability Physics Symposium - iRPS
dc.source.conferencedate17/04/2016
dc.source.conferencelocationPasadena, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7574568
imec.availabilityPublished - imec


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