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Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching
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Authors
Subhechha, Subhali
;
Govoreanu, Bogdan
;
Chen, Yangyin
;
Clima, Sergiu
;
De Meyer, Kristin
;
Van Houdt, Jan
;
Jurczak, Gosia
Conference
IEEE International Reliability Physics Symposium - iRPS
Title
Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching
Publication type
Proceedings paper
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