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Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching
Publication:
Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Subhechha, Subhali
;
Govoreanu, Bogdan
;
Chen, Yangyin
;
Clima, Sergiu
;
De Meyer, Kristin
;
Van Houdt, Jan
;
Jurczak, Gosia
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1960
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Acq. date: 2025-10-25
Citations
Metrics
Views
1960
since deposited on 2021-10-23
440
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations