Publication:

Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching

Date

2016
Proceedings Paper
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dc.contributor.authorSubhechha, Subhali
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorChen, Yangyin
dc.contributor.authorClima, Sergiu
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-23T15:17:44Z
dc.date.available2021-10-23T15:17:44Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27359
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7574568
dc.source.beginpage6C.2
dc.source.conferenceIEEE International Reliability Physics Symposium - iRPS
dc.source.conferencedate17/04/2016
dc.source.conferencelocationPasadena, CA USA
dc.title

Extensive reliability investigation of a-VMCO nonfilamentary RRAM: relaxation, retention and key differences to filamentary switching

dc.typeProceedings paper
dspace.entity.typePublication
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