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3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement
Publication:
3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement
Date
2016
Proceedings Paper
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34267.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wang, Teng
;
Bex, Pieter
;
Capuz, Giovanni
;
Duval, Fabrice
;
Inoue, Fumihiro
;
Gerets, Carine
;
Bertheau, Julien
;
Rebibis, Kenneth June
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
;
Natsukawa, Masanori
;
Mitsukura, Kazuyuki
;
Hatakeyama, Keiichi
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2027
since deposited on 2021-10-23
Acq. date: 2025-10-27
Citations
Metrics
Views
2027
since deposited on 2021-10-23
Acq. date: 2025-10-27
Citations