dc.contributor.author | Aouassa, Mansour | |
dc.contributor.author | Vrielinck, Henk | |
dc.contributor.author | Simoen, Eddy | |
dc.date.accessioned | 2021-10-24T02:52:41Z | |
dc.date.available | 2021-10-24T02:52:41Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27755 | |
dc.source | IIOimport | |
dc.title | Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 181 | |
dc.source.endpage | 190 | |
dc.source.conference | Semiconductor Process Integration 10 | |
dc.source.conferencedate | 3/10/2017 | |
dc.source.conferencelocation | National Harbor, MD USA | |
dc.identifier.url | http://ecst.ecsdl.org/content/80/4/181 | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 80, Issue 4 | |