Publication:

Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots

Date

2017

Proceedings Paper

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Files

41108.pdf 361.79 KB

Author(s)

Aouassa, Mansour

;

Vrielinck, Henk

;

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1926 since deposited on 2021-10-24

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Acq. date: 2026-04-06