Publication:
Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots
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1925 since deposited on 2021-10-24
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Acq. date: 2026-01-08
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1925 since deposited on 2021-10-24
2last month
2last week
Acq. date: 2026-01-08
Citations