Publication:
Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots
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1923 since deposited on 2021-10-24
1last month
Acq. date: 2025-12-15
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1923 since deposited on 2021-10-24
1last month
Acq. date: 2025-12-15
Citations