dc.contributor.author | Bahrenberg, Lukas | |
dc.contributor.author | Danylyuk, Serhiy | |
dc.contributor.author | Brose, Sascha | |
dc.contributor.author | Pollentier, Ivan | |
dc.contributor.author | Timmermans, Marina | |
dc.contributor.author | Gallagher, Emily | |
dc.contributor.author | Stollenwerk, Jochen | |
dc.contributor.author | Loosen, Peter | |
dc.date.accessioned | 2021-10-24T02:54:26Z | |
dc.date.available | 2021-10-24T02:54:26Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27787 | |
dc.source | IIOimport | |
dc.title | Characterization of pellicle membranes by lab-based spectroscopic reflectance and transmittance measurements in the extreme ultraviolet | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Pollentier, Ivan | |
dc.contributor.imecauthor | Timmermans, Marina | |
dc.contributor.imecauthor | Gallagher, Emily | |
dc.contributor.orcidimec | Pollentier, Ivan::0000-0002-4266-6500 | |
dc.contributor.orcidimec | Timmermans, Marina::0000-0001-9805-8259 | |
dc.contributor.orcidimec | Gallagher, Emily::0000-0002-2927-8298 | |
dc.identifier.doi | 10.1117/12.2280579 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 104501L | |
dc.source.conference | International Conference on Extreme Ultraviolet Lithography | |
dc.source.conferencedate | 11/09/2017 | |
dc.source.conferencelocation | Monterey, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 10450 | |