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Sequential infiltration synthesis for line edge roughness mitigation of EUV resist
Publication:
Sequential infiltration synthesis for line edge roughness mitigation of EUV resist
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Date
2017
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36934.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baryshnikova, Marina
;
De Simone, Danilo
;
Chan, BT
;
Rincon Delgadillo, Paulina
;
Vandenberghe, Geert
;
Kachel, Krzysztof
;
Knaepen, Werner
;
Maes, Jan
;
De Roest, David
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1981
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Acq. date: 2026-01-10
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Metrics
Views
1981
since deposited on 2021-10-24
3
last month
2
last week
Acq. date: 2026-01-10
Citations