Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Process optimization and improvement of contact hole CDU and pattern placement with grapho-epitaxy DSA with EUV patterned templates
Metadata
Show full item record
Authors
Boeckx, Carolien
Conference
Electron, Ion, and Photon Beam Technology and Nanofabrication
Title
Process optimization and improvement of contact hole CDU and pattern placement with grapho-epitaxy DSA with EUV patterned templates
Publication type
Proceedings paper
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login