Authors

Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Carin, Regis; Veloso, Anabela; Collaert, Nadine; Thean, Aaron

ISSN

0038-1101

Issue

1

Journal

Solid-State Electronics

Volume

128

Title

Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology

Publication type

Journal article