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Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology
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Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boudier, Dimitri
;
Cretu, Bogdan
;
Simoen, Eddy
;
Carin, Regis
;
Veloso, Anabela
;
Collaert, Nadine
;
Thean, Aaron
Journal
Solid-State Electronics
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1999
since deposited on 2021-10-24
4
last month
Acq. date: 2026-01-11
Citations
Metrics
Views
1999
since deposited on 2021-10-24
4
last month
Acq. date: 2026-01-11
Citations