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On trap identification in Gate-All-Around (GAA) Nanowire (NW) MOSFETs using Low Frequency Noise spectroscopy
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Authors
Boudier, Dimitri
;
Cretu, Bogdan
;
Simoen, Eddy
;
Veloso, Anabela
;
Collaert, Nadine
Conference
International Conference on Noise and 1/f Fluctuations - ICNF
Title
On trap identification in Gate-All-Around (GAA) Nanowire (NW) MOSFETs using Low Frequency Noise spectroscopy
Publication type
Proceedings paper
Embargo date
9999-12-31
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