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Hybrid copper dielectric direct bonding of 200mm CMOS wafers with five metal levels: morphologic, electrical and reliability characterization
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Authors
Cavaco, Celso
;
Peng, Lan
;
Guerrieri, Stefano
;
Osman, Haris
Conference
International Wafer-Level Packaging Conference - IWLP
Title
Hybrid copper dielectric direct bonding of 200mm CMOS wafers with five metal levels: morphologic, electrical and reliability characterization
Publication type
Proceedings paper
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