Authors

Bellens, Rudi; De Schrijver, Erik; Van den Bosch, Geert; Groeseneken, Guido; Heremans, Paul; Maes, Herman

Issue

3

Journal

IEEE Transactions on Electron Devices

Volume

41

Title

On the hot-carrier-induced post-stress interface trap generation in n-channel MOS transistors

Publication type

Journal article

Embargo date

9999-12-31