Publication:
vfTLP characteristics of ESD diodes in bulk Si gate-all-around vertically stacked horizontal nanowire technology
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1887 since deposited on 2021-10-24
1last month
Acq. date: 2026-02-25
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1887 since deposited on 2021-10-24
1last month
Acq. date: 2026-02-25
Citations