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Framework for automated tests of LTE physical layers

dc.contributor.authorde Figueiredo, F.A.P.
dc.contributor.authorMathilde, F.
dc.contributor.authorPizzini, L.R.
dc.contributor.authorFigueiredo, F.
dc.contributor.authorCarillo, D.
dc.contributor.authorMoerman, Ingrid
dc.date.accessioned2021-10-24T03:47:16Z
dc.date.available2021-10-24T03:47:16Z
dc.date.issued2017-08
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28119
dc.sourceIIOimport
dc.titleFramework for automated tests of LTE physical layers
dc.typeProceedings paper
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceXXIV International Congress of Electrical Engineering, Electronics and Computing
dc.source.conferencedate15/08/2017
dc.source.conferencelocationCusco Peru
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5090-6363-5


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