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Quantitative retention model for filamentary oxide-based resistive RAM
Publication:
Quantitative retention model for filamentary oxide-based resistive RAM
Date
2017
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Chen, Michael
;
Celano, Umberto
;
Fantini, Andrea
;
Goux, Ludovic
;
Linten, Dimitri
;
Kar, Gouri Sankar
Journal
Microelectronic Engineering
Abstract
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1889
since deposited on 2021-10-24
Acq. date: 2025-10-26
Citations
Metrics
Views
1889
since deposited on 2021-10-24
Acq. date: 2025-10-26
Citations