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Quantitative retention model for filamentary oxide-based resistive RAM
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Authors
Degraeve, Robin
;
Chen, Michael
;
Celano, Umberto
;
Fantini, Andrea
;
Goux, Ludovic
;
Linten, Dimitri
;
Kar, Gouri Sankar
ISSN
0167-9317
Journal
Microelectronic Engineering
Volume
178
Title
Quantitative retention model for filamentary oxide-based resistive RAM
Publication type
Journal article
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