Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs

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Authors

Duan, Meng; Zhang, Jian Fu; Ji, Zhigang; Zhang, Wei Dong; Kaczer, Ben; Asenov, Asen

ISSN

0018-9383

Issue

6

Journal

IEEE Transactions on Electron Devices

Volume

64

Title

Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs

Publication type

Journal article

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