Authors

Franco, Jacopo; Putcha, Vamsi; Vais, Abhitosh; Sioncke, Sonja; Waldron, Niamh; Zhou, Daisy; Rzepa, Gerhard; Roussel, Philippe; Groeseneken, Guido; Heyns, Marc; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Characterization of oxide defects in InGaAs MOS gate stacks for high-mobility n-channel MOSFETs

Publication type

Proceedings paper

Embargo date

9999-12-31