Optimizing the MOS capacitor design to study large area 2D-oxide interface

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Authors
Gaur, Abhinav; Lin, Dennis; Chiappe, Daniele; Adelmann, Christoph; Van Houdt, Jan; Mocuta, Dan; Heyns, Marc; Radu, Iuliana
Conference
48th IEEE Semiconductor Interface Specialists Conference - SISC
Title
Optimizing the MOS capacitor design to study large area 2D-oxide interface
Publication type
Meeting abstract
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