Authors

Grasser, T.; Waltl, M.; Puschkarsky, K.; Stampfer, B.; Rzepa, G.; Pobegen, G.; Reisinger, H.; Arimura, Hiroaki; Kaczer, Ben

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Implications of gate-sided hydrogen release for post-stress degradation build-up after BTI stress

Publication type

Proceedings paper

Embargo date

9999-12-31