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Time-dependent breakdown mechanisms and reliability improvement in edge terminated AlGaN/GaN Schottky diodes under HTRB tests
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1931 since deposited on 2021-10-24
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Acq. date: 2025-10-24
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Views
1931 since deposited on 2021-10-24
424item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations