Show simple item record

Single event latch-up: increased sensitivity from planar to FinFET

dc.contributor.authorKarp, James
dc.contributor.authorHart, Michael J.
dc.contributor.authorMaillard, Pierre
dc.contributor.authorHellings, Geert
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-24T06:39:20Z
dc.date.available2021-10-24T06:39:20Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28643
dc.sourceIIOimport
dc.titleSingle event latch-up: increased sensitivity from planar to FinFET
dc.typeProceedings paper
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.conferenceIEEE Nuclear & Space Radiation Effects Conference - NSREC
dc.source.conferencedate17/07/2017
dc.source.conferencelocationNew Orleans, LA USA
dc.identifier.urlhttp://www.nsrec.com/program---wednesday.html
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record