Authors

Kazemi Esfeh, Babak; Kilchytska, Valeria; Parvais, Bertrand; Planes, N.; Haond, M; Flandre, D; Raskin, J.-P.

Conference

Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS

Title

Back-gate bias effect on FDSOI MOSFET RF figures of merits and parasitic elements

Publication type

Proceedings paper

Embargo date

9999-12-31