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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

dc.contributor.authorLambrecht, Niels
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorPues, Hugo
dc.date.accessioned2021-10-24T07:25:05Z
dc.date.available2021-10-24T07:25:05Z
dc.date.issued2017-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28748
dc.sourceIIOimport
dc.titleCircuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
dc.typeProceedings paper
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage141
dc.source.endpage145
dc.source.conference11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits - EMCCompo
dc.source.conferencedate4/07/2017
dc.source.conferencelocationSt.-Petersbrug Russia
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-2689-4


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