dc.contributor.author | Lazzarino, Frederic | |
dc.contributor.author | Paolillo, Sara | |
dc.contributor.author | Antony, Peter | |
dc.contributor.author | De Roest, David | |
dc.contributor.author | Seong, TaeGeun | |
dc.contributor.author | Wu, Yizhi | |
dc.contributor.author | Decoster, Stefan | |
dc.contributor.author | Rutigliani, Vito | |
dc.contributor.author | Lorusso, Gian | |
dc.contributor.author | Constantoudis, Vassilios | |
dc.contributor.author | Van Elshocht, Sven | |
dc.contributor.author | Piumi, Daniele | |
dc.contributor.author | Barla, Kathy | |
dc.date.accessioned | 2021-10-24T07:34:24Z | |
dc.date.available | 2021-10-24T07:34:24Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28769 | |
dc.source | IIOimport | |
dc.title | Exploration of a low-temperature PEALD technology to trim and smooth 193i photoresist | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Lazzarino, Frederic | |
dc.contributor.imecauthor | Paolillo, Sara | |
dc.contributor.imecauthor | De Roest, David | |
dc.contributor.imecauthor | Decoster, Stefan | |
dc.contributor.imecauthor | Lorusso, Gian | |
dc.contributor.imecauthor | Van Elshocht, Sven | |
dc.contributor.imecauthor | Piumi, Daniele | |
dc.contributor.imecauthor | Barla, Kathy | |
dc.contributor.orcidimec | Lazzarino, Frederic::0000-0001-7961-9727 | |
dc.contributor.orcidimec | Decoster, Stefan::0000-0003-1162-9288 | |
dc.contributor.orcidimec | Van Elshocht, Sven::0000-0002-6512-1909 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 101460K | |
dc.source.conference | Advances in Patterning Materials and Processes XXXIV | |
dc.source.conferencedate | 26/02/2017 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | http://spie.org/Publications/Proceedings/Paper/10.1117/12.2258040 | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 10146 | |