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dc.contributor.authorLazzarino, Frederic
dc.contributor.authorPaolillo, Sara
dc.contributor.authorAntony, Peter
dc.contributor.authorDe Roest, David
dc.contributor.authorSeong, TaeGeun
dc.contributor.authorWu, Yizhi
dc.contributor.authorDecoster, Stefan
dc.contributor.authorRutigliani, Vito
dc.contributor.authorLorusso, Gian
dc.contributor.authorConstantoudis, Vassilios
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorPiumi, Daniele
dc.contributor.authorBarla, Kathy
dc.date.accessioned2021-10-24T07:34:24Z
dc.date.available2021-10-24T07:34:24Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28769
dc.sourceIIOimport
dc.titleExploration of a low-temperature PEALD technology to trim and smooth 193i photoresist
dc.typeProceedings paper
dc.contributor.imecauthorLazzarino, Frederic
dc.contributor.imecauthorPaolillo, Sara
dc.contributor.imecauthorDe Roest, David
dc.contributor.imecauthorDecoster, Stefan
dc.contributor.imecauthorLorusso, Gian
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorPiumi, Daniele
dc.contributor.imecauthorBarla, Kathy
dc.contributor.orcidimecLazzarino, Frederic::0000-0001-7961-9727
dc.contributor.orcidimecDecoster, Stefan::0000-0003-1162-9288
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage101460K
dc.source.conferenceAdvances in Patterning Materials and Processes XXXIV
dc.source.conferencedate26/02/2017
dc.source.conferencelocationSan Jose, CA USA
dc.identifier.urlhttp://spie.org/Publications/Proceedings/Paper/10.1117/12.2258040
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 10146


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