2D MoS2 film thickness impact on the efficiency of surface-doped devices

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Authors
Lockhart de la Rosa, Cesar Javier; Arutchelvan, Goutham; Leonhardt, Alessandra; Huyghebaert, Cedric; Radu, Iuliana; Heyns, Marc; De Gendt, Stefan
Conference
48th IEEE Semiconductor Interface Specialists Conference - SISC
Title
2D MoS2 film thickness impact on the efficiency of surface-doped devices
Publication type
Meeting abstract
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