Publication:

A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards

Date

2017-09

Proceedings Paper

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Author(s)

Marinissen, Erik Jan

;

;

De Wachter, Bart

;

Kiesewetter, Joerg

;

;

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1911 since deposited on 2021-10-24

2last month

Acq. date: 2026-02-25