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A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorFodor, Ferenc
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorHill, Eric
dc.contributor.authorSmith, Ken
dc.date.accessioned2021-10-24T08:46:58Z
dc.date.available2021-10-24T08:46:58Z
dc.date.issued2017-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28920
dc.sourceIIOimport
dc.titleA fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceIEEE International Test Conference Asia - ITC-Asia
dc.source.conferencedate13/09/2017
dc.source.conferencelocationTaipei Taiwan
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8097130
imec.availabilityPublished - imec


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