Publication:
Atom probe tomography analysis of SiGe fins embedded in SiO2: facts and artefacts
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2007 since deposited on 2021-10-24
444item.page.metrics.field.last-week
Acq. date: 2025-10-24
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Metrics
Views
2007 since deposited on 2021-10-24
444item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations