Authors

Noltsis, Michalis; Maragkoudaki, Eleni; Rodopoulos, Dimitrios; Catthoor, Francky; Soudris, Dimitrios

Conference

27th International Symposium on Power and Timing Modeling, Optimization and Simulation - PATMOS

Title

Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

Publication type

Proceedings paper

Embargo date

9999-12-31