Publication:
Variability study with CD-SEM metrology for STT-MRAM: correlation analysis between physical dimensions and electrical property of the memory element
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2123 since deposited on 2021-10-24
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Acq. date: 2026-04-27
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Statistics
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2123 since deposited on 2021-10-24
3last month
2last week
Acq. date: 2026-04-27
Citations