dc.contributor.author | Ohashi, Takeyoshi | |
dc.contributor.author | Yamaguchi, Atsuko | |
dc.contributor.author | Hasumi, Kazuhisa | |
dc.contributor.author | Inoue, Osamu | |
dc.contributor.author | Ikota, Masami | |
dc.contributor.author | Lorusso, Gian | |
dc.contributor.author | Donadio, Gabriele Luca | |
dc.contributor.author | Yasin, Farrukh | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.date.accessioned | 2021-10-24T10:21:48Z | |
dc.date.available | 2021-10-24T10:21:48Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29104 | |
dc.source | IIOimport | |
dc.title | Variability study with CD-SEM metrology for STT-MRAM: correlation analysis between physical dimensions and electrical property of the memory element | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Lorusso, Gian | |
dc.contributor.imecauthor | Donadio, Gabriele Luca | |
dc.contributor.imecauthor | Yasin, Farrukh | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Yasin, Farrukh::0000-0002-7295-0254 | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1117/12.2257908 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 101450H | |
dc.source.conference | Metrology, Inspection, and Process Control for Microlithography XXXI | |
dc.source.conferencedate | 26/02/2017 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 10145 | |