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An ultra-low power, robust photoplethysmographic readout exploiting compressive sampling, artifact reduction and sensor fusion

dc.contributor.authorPamula Venkata, Rajesh
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorVerhelst, Marian
dc.contributor.authorVan Helleputte, Nick
dc.date.accessioned2021-10-24T10:35:47Z
dc.date.available2021-10-24T10:35:47Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29129
dc.sourceIIOimport
dc.titleAn ultra-low power, robust photoplethysmographic readout exploiting compressive sampling, artifact reduction and sensor fusion
dc.typeOral presentation
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorVerhelst, Marian
dc.contributor.imecauthorVan Helleputte, Nick
dc.contributor.orcidimecVerhelst, Marian::0000-0003-3495-9263
dc.contributor.orcidimecVan Helleputte, Nick::0000-0002-7511-1923
dc.source.peerreviewno
dc.source.conferenceWorkshop on Advances in Analog Circuit Design - AACD
dc.source.conferencedate28/03/2017
dc.source.conferencelocationEindhoven Netherlands
imec.availabilityPublished - imec


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