Publication:
A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1985 since deposited on 2021-10-01
Acq. date: 2025-12-23
Citations
Metrics
Views
1985 since deposited on 2021-10-01
Acq. date: 2025-12-23
Citations