A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress

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Authors

Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Roussel, Philippe; Groeseneken, Guido; Maes, Herman

Issue

4

Journal

Journal of Electrostatics

Volume

42

Title

A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress

Publication type

Journal article

Embargo date

9999-12-31

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