dc.contributor.author | Ruzyllo, Jerzy | |
dc.contributor.author | Röhr, Erika | |
dc.contributor.author | Baeyens, Martien | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-01T08:50:44Z | |
dc.date.available | 2021-10-01T08:50:44Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2921 | |
dc.source | IIOimport | |
dc.title | Role of UV/chlorine exposure during dry surface conditioning before integrated epi deposition process | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.source.peerreview | no | |
dc.source.conference | 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS | |
dc.source.conferencedate | 21/09/1998 | |
dc.source.conferencelocation | Oostende belgium | |
imec.availability | Published - imec | |
imec.internalnotes | Publ. in 1999; Zie C3756 | |