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Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 resistive random access memory
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1913 since deposited on 2021-10-24
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Acq. date: 2025-10-25
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1913 since deposited on 2021-10-24
419item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations