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Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 resistive random access memory
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Authors
Puglisi, F.M.
;
Celano, Umberto
;
Padovani, A.
;
Vandervorst, Wilfried
;
Larcher, Luca
;
Pavan, P.
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 resistive random access memory
Publication type
Proceedings paper
Embargo date
9999-12-31
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