Publication:
Treatments for reliability improvement in thick oxides diffusion and gate replacement (D&GR) I/O transistors
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1884 since deposited on 2021-10-24
2last month
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Acq. date: 2026-05-17
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Statistics
Views
1884 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-05-17
Citations